Imaging Modes

The experiment guides for each imaging mode provide practical, procedural guidance for operating the system to collect a wide range of different types of data. Select an Imaging Mode below for more information:

• ScanAsyst, Bruker patented self-optimizing scan mode
• Contact AFM, including Lateral Force Mode
• TappingMode AFM
• Force Imaging
• Magnetic Force Microscopy (MFM)
• Electric Techniques, including:
  • Electric Force Microscopy (EFM)
  • Surface Potential Detection
• Scanning Tunneling Microscopy (STM)
• Piezoresponse Force Microscopy
• Applications Modules, including:
  • Conductive Atomic Force Microscopy (C-AFM)
  • Scanning Capacitance Microscopy (SCM)
  • Scanning Spreading Resistance Microscopy (SSRM)
  • Tunneling Atomic Force Microscopy (TUNA), including Bruker's breakthrough PeakForce TUNA imaging mode.

Several experimental modes or applications modules are not covered in this User Guide:

• HarmoniX
• Electrochemistry
• NanoMan

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